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Seoul National University SNU Quantum Information Science Group

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Phys. Rev. Lett. 130, 020802

Faithfulness and Sensitivity for Ancilla-Assisted Process Tomography

Authors

S. H. Lie and H. Jeong

Journal

Phys. Rev. Lett. 130, 020802

Year

2023

2023PRL
[1] S. H. Lie and H. Jeong, Faithfulness and Sensitivity for Ancilla-Assisted Process Tomography, Phys. Rev. Lett. 130, 020802 (2023).